US Patent Issued to STMicroelectronics International on Nov. 25 for "Low pin count scan with no dedicated scan enable pin" (Indian Inventors)

ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,480,993, issued on Nov. 25, was assigned to STMicroelectronics International N.V. (Geneva).

"Low pin count scan with no dedicated scan enable pin" was invented by Sandeep Jain (Noida, India) and Shalini Pathak (Gurgaon, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "According to an embodiment, a method for testing using scan chains, without an independent scan enable pin, is proposed. The method includes selectively indicating a capture phase and a load/unload phase for the scan chain based on an encoding of a scan enable signal in an expected signal and a masking signal; loading test parameters to the scan chain during the load/unload phase; oper...