US Patent Issued to STMicroelectronics International on May 20 for "Partial chain reconfiguration for test time reduction" (Indian Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,306,246, issued on May 20, was assigned to STMicroelectronics International N.V. (Geneva).

"Partial chain reconfiguration for test time reduction" was invented by Sandeep Jain (Noida, India) and Shalini Pathak (Gurgaon, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "According to an embodiment, a first aspect relates to a method for testing a scan chain. The method includes segmenting the scan chain into two or more segments; adding a respective multiplexer at end points of each segment, wherein each pair of sequential segment shares a common multiplexer in between; asserting a select signal at a select terminal of the multiplexers such that a rela...