ALEXANDRIA, Va., July 16 -- United States Patent no. 12,360,161, issued on July 15, was assigned to STMicroelectronics International N.V. (Geneva).
"Scan circuit and method" was invented by Venkata Narayanan Srinivasan (Greater Noida, India), Shiv Kumar Vats (Greater Noida, India) and Tripti Gupta (Ghaziabad, India).
According to the abstract* released by the U.S. Patent & Trademark Office: "In an embodiment, a method for performing scan includes: entering scan mode; receiving a test pattern; applying the test pattern through a first scan chain by asserting and deasserting a scan enable signal to respectively perform shift and capture operations to the first scan chain; while applying the test pattern through the first scan chain, control...