US Patent Issued to STMicroelectronics International on Feb. 10 for "Clock phase noise measurement circuit and method" (Indian Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,546,809, issued on Feb. 10, was assigned to STMicroelectronics International N.V. (Geneva).

"Clock phase noise measurement circuit and method" was invented by Ankur Bal (Greater Noida, India) and Sri Ram Gupta (Noida, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement is made of jitter present in a jittery clock signal. A digital sinusoid generator circuit clocked by the jittery clock signal generates a pulse density modulation (PDM) signal corresponding to a sinusoid waveform. The PDM signal is converted by a sigma-delta modulator circuit to an oscillating frequency signal with an output of digital values digital values indicative of os...