US Patent Issued to STMicroelectronics International on Dec. 9 for "Test pattern reset control circuit" (Indian Inventors)

ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,493,075, issued on Dec. 9, was assigned to STMicroelectronics International N.V. (Geneva).

"Test pattern reset control circuit" was invented by Harish Kumar (Noida, India) and Nitin Kumar (Greater Noida, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "A scan reset control circuit includes a single scan reset input configured to receive a reset signal, a plurality of scan reset outputs configured to be coupled to a plurality of circuit blocks in a one-to-one ratio, a plurality of writable non-scan test data registers including register outputs configured to assert or deassert the reset signal, and a plurality of reset enable circuits coupled to the p...