ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,399,218, issued on Aug. 26, was assigned to STMicroelectronics International N.V. (Geneva).
"PORs testing in multiple power domain devices" was invented by Venkata Narayanan Srinivasan (Greater Noida, India), Mayankkumar Hareshbhai Niranjani (Lathi, India) and Gourav Garg (Kaithal, India).
According to the abstract* released by the U.S. Patent & Trademark Office: "According to an embodiment, a method for testing multiple power-on-resets in a system-on-chip with a multi-power domain architecture operating under a dual power flow mode is provided. The method includes powering up the system-on-chip to full power mode, decoupling a third power domain from a first power domain and a secon...