US Patent Issued to STMicroelectronics International on April 1 for "Compression-based scan test system" (Indian Inventors)

ALEXANDRIA, Va., April 2 -- United States Patent no. 12,265,121, issued on April 1, was assigned to STMicroelectronics International N.V. (Geneva).

"Compression-based scan test system" was invented by Sandeep Jain (Noida, India), Shalini Pathak (Gurgaon, India) and Prateek Singh (Delhi, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "In accordance with an embodiment, a method for operating a Pseudo-Random Pattern Generator (PRPG) based scan test system includes: generating test patterns using a Pseudo-Random Pattern Generator (PRPG), generating the test patterns including clocking the PRPG using a first clock signal; loading the test patterns into a plurality of scan chains coupled to the PRPG; modifyin...