ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,461,044, issued on Nov. 4, was assigned to Stichting Imec Nederland (Wageningen, Netherlands).
"Device and method for dielectric material characterization" was invented by Rahul Yadav (Wageningen, Netherlands), Peter Offermans (Zaltbommel, Netherlands), Jan Willem de Wit (Deventer, Netherlands) and Bas Boom (Maarssen, Netherlands).
According to the abstract* released by the U.S. Patent & Trademark Office: "A device for dielectric material characterization of a test sample is provided. The device comprises a resonator block comprising a groove at at least one side of the resonator block, wherein the groove comprises at least a first inclined surface and a second inclined surface and is...