US Patent Issued to Starkey Laboratories on June 17 for "Artifact detection and logging for tuning of feedback canceller" (American, German Inventors)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,335,688, issued on June 17, was assigned to Starkey Laboratories Inc. (Eden Prairie, Minn.).

"Artifact detection and logging for tuning of feedback canceller" was invented by Henning Schepker (Oldenburg, Germany) and Sina Miran (St Louis Park, Minn.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed herein, among other things, are systems and methods for artifact detection and tuning of a feedback canceller. A method includes detecting an artifact of a feedback canceller during operation of a hearing device. Artifact data associated with the detected artifact is stored in a memory of the hearing device, the artifact data including information rela...