ALEXANDRIA, Va., Sept. 3 -- United States Patent no. 12,405,290, issued on Sept. 2, was assigned to STAR TECHNOLOGIES (WUHAN) Co. LTD. (Wuhan, China).
"Probe testing device having elastic structure" was invented by Choon Leong Lou (Singapore).
According to the abstract* released by the U.S. Patent & Trademark Office: "A probe testing device having an elastic structure is provided. The probe testing device having the elastic structure includes a plurality of probe elements and a guide plate module. Each of the probe elements includes a body, a first contact segment, and a second segment, and is formed integrally. The guide plate module includes a first guide plate, a second guide plate, and a third guide plate that are parallel to each oth...