US Patent Issued to SQ Technology (Shanghai), Inventec on Sept. 30 for "JTAG standard pin test system" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,521, issued on Sept. 30, was assigned to SQ Technology (Shanghai) Corp. (Shanghai) and Inventec Corp. (Taipei, Taiwan).

"JTAG standard pin test system" was invented by Qiu-Yue Duan (Shanghai), Xin-Ying Xie (Shanghai) and Lin Zhang (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "A boundary-scan standard pin test system is disclosed. In the system, to-be-tested slots are electrically connected to form different to-be-tested series chains, or riser cards which are inserted into the to-be-tested slots are electrically connected to each other through first boundary-scan input interfaces and first boundary-scan output interfaces thereof or throu...