US Patent Issued to SPECTRALYS INNOVATION on June 17 for "Device for spectroscopic analysis of a sample and method analyzing a sample by means of such a device" (French Inventors)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,332,171, issued on June 17, was assigned to SPECTRALYS INNOVATION (Asnieres-sur-Seine, France).

"Device for spectroscopic analysis of a sample and method analyzing a sample by means of such a device" was invented by Abdelhaq Acharid (Luzarches, France), Ines Birlouez (Ermont, France), Papus Boutaouakou (Chessy, France), Olivier Charles-Francois (Paris), Elliot Legrand (Bagnolet, France), Monji Messaoudi (Aubervilliers, France), Stephane Oddos (Boulogne Billancourt, France) and Clement Voisin (Hermaville, France).

According to the abstract* released by the U.S. Patent & Trademark Office: "A device is for analyzing a heterogeneous sample (S). The device includes a measurement module ha...