ALEXANDRIA, Va., March 19 -- United States Patent no. 12,255,056, issued on March 18, was assigned to Southwest Jiaotong University (Chengdu, China).
"Diagnostic method and system for measuring potential and electric field of plasma" was invented by Yuhong Xu (Chengdu, China), Danni Wu (Chengdu, China), Yucai Li (Chengdu, China), Haifeng Liu (Chengdu, China), Jun Cheng (Chengdu, China), Junfeng Shen (Chengdu, China), Hai Liu (Chengdu, China), Xianqu Wang (Chengdu, China), Jie Huang (Chengdu, China), Xin Zhang (Chengdu, China), Jun Hu (Chengdu, China) and Wei Li (Chengdu, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "A diagnostic method and system for measuring potential and electric field of plasma ar...