ALEXANDRIA, Va., July 9 -- United States Patent no. 12,352,663, issued on July 8, was assigned to SORBONNE UNIVERSITE (Paris) and CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (Paris).

"Method and apparatus for analyzing a structure" was invented by Laurent Ponson (Paris), Estelle Berthier (Vanves, France) and Ashwij Mayya (Paris).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for analyzing a structure, including a measurement of a duration T, a mechanical S or acoustic energy Sac and/or a spatial extension Xi of a sequence and/or a number of mechanical or acoustic events N or Nac in that sequence and/or of the mechanical A or acoustic Aac energies of the events of that sequence, and/or a measurement ...