US Patent Issued to SOOCHOW UNIVERSITY on Nov. 18 for "Method and apparatus for measuring topological charge of partially coherent fractional vortex beam" (Chinese Inventors)

ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,474,204, issued on Nov. 18, was assigned to SOOCHOW UNIVERSITY (Suzhou, China).

"Method and apparatus for measuring topological charge of partially coherent fractional vortex beam" was invented by Zhuoyi Wang (Suzhou, China), Chengliang Zhao (Suzhou, China), Xingyuan Lu (Suzhou, China), Qidong Lin (Suzhou, China), Xiaotan Lu (Suzhou, China), Xuechun Zhao (Suzhou, China) and Yangjian Cai (Suzhou, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A to-be-measured partially coherent fractional vortex beam passes through a scattering object, an error between measurable information and to-be-measured information is minimized by using an optimization algor...