US Patent Issued to SONY GROUP on Jan. 27 for "Particle analysis system, particle analysis method, and flow cytometer system" (Japanese Inventors)

ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,535,401, issued on Jan. 27, was assigned to SONY GROUP Corp. (Tokyo).

"Particle analysis system, particle analysis method, and flow cytometer system" was invented by Akio Furukawa (Tokyo) and Yusaku Nakashima (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An operation time is shortened. A particle analysis system according to an embodiment includes an imaging unit (13) configured to detect, as an event, a luminance change of light from a particle in a container, a first scanning unit (14) configured to scan a focal position of the imaging unit in a depth direction of the container, and a processing unit (103) configured to measure a state in the ...