ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,493,685, issued on Dec. 9, was assigned to SONY GROUP Corp. (Tokyo).
"Method and apparatus for testing a device under test" was invented by Fabiano Anemone (Stuttgart, Germany), Alexei Karpov (Stuttgart, Germany), Cederic Laumen (Stuttgart, Germany), Stefan Rabin (Stuttgart, Germany), Geoffrey Van Den Berge (Stuttgart, Germany) and Simon Gillet (Stuttgart, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method for testing a Device Under Test (DUT) is provided. The method includes emulating a Trusted Execution Environment (TEE) of the DUT by means of a software emulator in order to provide an emulated TEE. The method further comprises interceptin...