US Patent Issued to Sony Group on Aug. 5 for "Particle analyzer, particle analysis method, and optical measurement device" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,379,304, issued on Aug. 5, was assigned to Sony Group Corp. (Tokyo).

"Particle analyzer, particle analysis method, and optical measurement device" was invented by Takeshi Hatakeyama (Chiba, Japan), Satoshi Nagae (Tokyo), Masanobu Nonaka (Kanagawa, Japan), Kenji Ishida (Tokyo), Naomichi Kikuchi (Kanagawa, Japan) and Takashi Kato (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A particle analyzer (100) includes: a light source that emits excitation light (EL1) including light having a wavelength of 400 nm or less; a lens structure (41) that collects excitation light (EL1) at a predetermined position (51s) in a flow path (53); a detection unit (7) tha...