ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,442,779, issued on Oct. 14, was assigned to Smiths Detection Inc. (Edgewood, Md.).
"Systems and methods for inspection portals" was invented by Joseph Bendahan (San Jose, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection portal includes a first x-ray source configured to emit a first beam, a first backscatter detector configured to detect backscatter from the first beam, a second x-ray source configured to emit a second beam, a second backscatter detector configured to detect backscatter from the second beam, and at least one first collimator and at least one second collimator, each oriented to detect backscatter from the associated be...