ALEXANDRIA, Va., June 5 -- United States Patent no. 12,276,770, issued on April 15, was assigned to SMITHS DETECTION FRANCE S.A.S. (Vitry-sur-Seine, France).
"Resolution improvement in dual energy" was invented by Guillaume Jegou (Vitry-sur-Seine, France) and Sebastien Grabeuil (Vitry-sur-Seine, France).
According to the abstract* released by the U.S. Patent & Trademark Office: "In some embodiments, a method for processing inspection data associated with cargo irradiated by a plurality N of pulses of inspection is provided. The method includes obtaining the inspection data, the inspection data being representative of intensity values of pixels of an inspection image of the including data associated with a higher energy mode, and data asso...