ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,492,934, issued on Dec. 9, was assigned to SKF (China) Co Ltd (Shanghai).
"Device for measuring a parameter indicative of the rotational speed of a component" was invented by Jim Wei (Shanghai).
According to the abstract* released by the U.S. Patent & Trademark Office: "A device for measuring a parameter indicative of a rotational speed of a component includes a wired or wireless input configured to receive a vibration signal from a vibration sensor, a boost filter configured to filter the vibration signal, based on a predetermined frequency range, into a sinusoidal signal and, a comparator configured to generate a pulse waveform signal from the sinusoidal signal in order to read the ...