US Patent Issued to SK ON on July 1 for "Apparatus and method for determining defect of battery cell" (South Korean Inventors)

ALEXANDRIA, Va., July 3 -- United States Patent no. 12,345,771, issued on July 1, was assigned to SK ON Co. LTD. (Seoul, South Korea).

"Apparatus and method for determining defect of battery cell" was invented by Chang Mook Hwang (Daejeon, South Korea), Jong Hyuk Lee (Daejeon, South Korea) and Yoon Ji Jo (Daejeon, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus and a method for determining a defect of a battery cell are disclosed. The defect determination apparatus according to an aspect includes: a temperature measurement unit configured to measure an aging temperature of the battery cell; a period determination unit configured to determine an aging period of the battery cell; an SOC...