US Patent Issued to SK hynix on Nov. 18 for "Semiconductor device providing a test mode related to detecting a defect in a metal line" (South Korean Inventor)

ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,475,962, issued on Nov. 18, was assigned to SK hynix Inc. (Icheon-si, South Korea).

"Semiconductor device providing a test mode related to detecting a defect in a metal line" was invented by Byeong Cheol Lee (Icheon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor device including a main word line driver connected to a metal line and configured to transmit a main word line signal to the metal line in order to access at least one of memory cells that are included in a core circuit, the core circuit connected to the metal line and configured to transmit, as a delay main word line signal, the main word line signal that is rece...