US Patent Issued to SK hynix on Nov. 18 for "Method of measuring refractive index of semiconductor memory device and method of classifying product group using the same" (South Korean Inventors)

ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,475,963, issued on Nov. 18, was assigned to SK hynix Inc. (Icheon-si, South Korea).

"Method of measuring refractive index of semiconductor memory device and method of classifying product group using the same" was invented by Nam Cheol Jeon (Icheon-si, South Korea), Tae Un Youn (Icheon-si, South Korea) and Ho Jung Kang (Icheon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided herein is a method of measuring a refractive index of a semiconductor memory device and a method of classifying a product group of a semiconductor memory device using the same. The method of measuring a refractive index of a semiconductor memory device includes...