US Patent Issued to SK hynix on Nov. 11 for "Test device for determining an effective work function, method of manufacturing the same and method of determining an effective work function" (South Korean Inventor)

ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,467,893, issued on Nov. 11, was assigned to SK hynix Inc. (Icheon-si, South Korea).

"Test device for determining an effective work function, method of manufacturing the same and method of determining an effective work function" was invented by Gyeong Ho Hyun (Icheon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test device may include a test memory device, an insulation layer and a charge injection electrode. The test memory device may include a memory layer and a gate electrode layer on a semiconductor substrate. The insulation layer may be arranged on the test memory device. The charge injection electrode may be arranged on the insu...