ALEXANDRIA, Va., June 12 -- United States Patent no. 12,298,344, issued on May 13, was assigned to SK hynix Inc. (Icheon-si, South Korea).
"Leakage current detection circuit" was invented by Jong Seok Jung (Icheon-si, South Korea), Chan Keun Kwon (Icheon-si, South Korea), Kyeong Hwan Park (Icheon-si, South Korea), Young Kwan Lee (Icheon-si, South Korea) and Suk Hwan Choi (Icheon-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A leakage current detection circuit includes: a mirror circuit configured to copy a leakage current flowing through a node and generate a copy current in a copy node; an oscillation circuit including a charge storage unit, the oscillation circuit being connected to the co...