US Patent Issued to SK hynix on March 25 for "Semiconductor device capable of checking deterioration of select transistor and operating method thereof" (South Korean Inventors)

ALEXANDRIA, Va., March 26 -- United States Patent no. 12,260,912, issued on March 25, was assigned to SK hynix Inc. (Gyeonggi-do, South Korea).

"Semiconductor device capable of checking deterioration of select transistor and operating method thereof" was invented by Hyung Jin Choi (Gyeonggi-do, South Korea), In Gon Yang (Gyeonggi-do, South Korea) and Young Seung Yoo (Gyeonggi-do, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor device may include a memory cell array including a memory block including a plurality of memory strings connected between a plurality of bit lines and a common source line, a control circuit that generates a page buffer control signal, a voltage control signa...