US Patent Issued to SK hynix on March 18 for "Semiconductor device and method for performing test" (South Korean Inventor)

ALEXANDRIA, Va., March 19 -- United States Patent no. 12,254,937, issued on March 18, was assigned to SK hynix Inc. (Icheon-si Gyeonggi-do, South Korea).

"Semiconductor device and method for performing test" was invented by Choung Ki Song (Icheon-si Gyeonggi-do, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor device includes a self-test circuit configured to generate an internal clock having a higher frequency than a clock applied from a device external to the semiconductor device, to generate an instruction signal from a pre-instruction signal extracted through a data line, and to generate an internal control signal from the instruction signal. The semiconductor device also includ...