ALEXANDRIA, Va., March 12 -- United States Patent no. 12,250,009, issued on March 11, was assigned to SK hynix Inc. (Gyeonggi-do, South Korea).
"Interface device supporting test operation" was invented by Eun Ju Choe (Gyeonggi-do, South Korea), Ho Young Park (Gyeonggi-do, South Korea) and Jong Hwan Choi (Gyeonggi-do, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is an interface circuit including a first parallel-to-serial conversion circuit suitable for converting inverted parallel data in a parallel-to-serial manner to generate first output data in a test mode; a second parallel-to-serial conversion circuit suitable for converting non-inverted parallel data in the parallel-to-serial m...