ALEXANDRIA, Va., July 9 -- United States Patent no. 12,354,690, issued on July 8, was assigned to SK hynix Inc. (Icheon-si, South Korea).
"Semiconductor device and method of testing the semiconductor device" was invented by Jun Hyuk Lee (Icheon-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided herein is a semiconductor device and a method of testing the semiconductor device. The method of operating a semiconductor device includes initializing a latch included in a page buffer, applying a read pass voltage to a plurality of word lines, allowing at least one of the plurality of word lines to float, and performing a sensing operation on the page buffer."
The patent was filed on May 18, 20...