ALEXANDRIA, Va., July 16 -- United States Patent no. 12,362,034, issued on July 15, was assigned to SK hynix Inc. (Icheon-si, South Korea).
"Semiconductor device related to a parallel test" was invented by Hyun Seung Kim (Icheon-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "According to an embodiment of the present disclosure, a semiconductor device includes an even data input circuit configured to store, in an even core cell, data that is input through an even data pad and that has a first pattern in response to an even data input strobe signal in a write operation of a parallel test. The semiconductor device includes an odd data input circuit configured to store, in an odd core cell, data ...