US Patent Issued to SK hynix on Jan. 13 for "Semiconductor devices providing test mode related to reliability" (South Korean Inventor)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,525,268, issued on Jan. 13, was assigned to SK hynix Inc. (Icheon-si, South Korea).

"Semiconductor devices providing test mode related to reliability" was invented by Yun Suk Hong (Icheon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor device includes a pull-up source voltage generation circuit configured to drive a pull-up voltage to a normal voltage during a normal period and to drive the pull-source voltage to a test voltage during a test period. The semiconductor device also includes a pull-down source voltage generation circuit configured to drive a pull-down voltage to a ground voltage during the normal period and to...