ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,512,349, issued on Dec. 30, was assigned to SK hynix Inc. (Icheon-si, South Korea).
"Wafer yield analysis method and apparatus based on wafer map" was invented by Taebeom Kim (Icheon-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "An operation method of a wafer analysis device include: generating a wafer map that is an image visualizing and showing whether each of a plurality of chips included in a wafer is normal or defective; applying virtual normal chips to the wafer map such that the number of chips adjacent to each of all the chips on an outermost edge of the wafer map is eight; obtaining the number of normal chips among eight adjace...