US Patent Issued to SK hynix on Dec. 16 for "Memory device for performing bad block check, method of operating memory device, and method of operating storage controller communicating with memory device" (South Korean Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,499,964, issued on Dec. 16, was assigned to SK hynix Inc. (Icheon-si, South Korea).

"Memory device for performing bad block check, method of operating memory device, and method of operating storage controller communicating with memory device" was invented by Sung Hwa Hong (Icheon-si Gyeonggi-do, South Korea), Tae Heui Kwon (Icheon-si Gyeonggi-do, South Korea) and Byung Goo Cho (Icheon-si Gyeonggi-do, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided herein may be a memory device for performing a bad block check, a method of operating the memory device, and a method of operating a storage controller communicating with the memory device....