US Patent Issued to SK hynix on Aug. 26 for "Semiconductor device having defect detection circuit" (South Korean Inventor)

ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,399,213, issued on Aug. 26, was assigned to SK hynix Inc. (Icheon-si Gyeonggi-do, South Korea).

"Semiconductor device having defect detection circuit" was invented by Young Ock Hong (Icheon-si Gyeonggi-do, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "There is provided a semiconductor device having a defect detection circuit. The semiconductor device includes a plurality of upper bonding pads, a plurality of lower bonding pads adhered to the plurality of upper bonding pads, a first upper line electrically connecting upper bonding pads, among the plurality of upper bonding pads, to each other; a plurality of lower lines electrically connecte...