US Patent Issued to SK hynix on April 29 for "Test circuit and receiving circuit having test function" (South Korean Inventors)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,288,589, issued on April 29, was assigned to SK hynix Inc. (Icheon-si, South Korea).

"Test circuit and receiving circuit having test function" was invented by Gi Moon Hong (Icheon-si, South Korea) and Dae Han Kwon (Icheon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test circuit may include: a plurality of replication receivers configured to generate a plurality of oscillation signal pairs in response to a plurality of oscillation enable signals; and an oscillation control circuit configured to generate the plurality of oscillation enable signals in response to a test enable signal, and to generate a detection signal in response to an...