ALEXANDRIA, Va., June 6 -- United States Patent no. 12,283,533, issued on April 22, was assigned to SK hynix Inc. (Gyeonggi-do, South Korea).

"Test circuit of semiconductor apparatus and test system including the same" was invented by Jong Seok Jung (Gyeonggi-do, South Korea), Chan Keun Kwon (Gyeonggi-do, South Korea), Jong Seok Kim (Gyeonggi-do, South Korea) and Young Kwan Lee (Gyeonggi-do, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test circuit of a semiconductor apparatus includes a first resistor, a second resistor and a feed-back loop circuit. The first resistor is coupled between a pad and a test element. The second resistor is coupled to the first resistor in a parallel manner. The f...