US Patent Issued to SK hynix on April 22 for "Test circuit for detecting word line defect and semiconductor apparatus including the same" (South Korean Inventor)

ALEXANDRIA, Va., June 6 -- United States Patent no. 12,283,331, issued on April 22, was assigned to SK hynix Inc. (Icheon-si, South Korea).

"Test circuit for detecting word line defect and semiconductor apparatus including the same" was invented by Suk Hwan Choi (Icheon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present technology includes: a current mirror configured to apply a test current that is generated by a test voltage to a selected word line, among a plurality of word lines, and to generate a copy current by copying the test current; a comparison circuit configured to compare at least one reference current with the copy current to generate a comparison result signal; and a te...