US Patent Issued to SK Hynix NAND Product Solutions on Sept. 23 for "Variable node data management for integrity check in memory systems" (Canadian Inventor)

ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,423,176, issued on Sept. 23, was assigned to SK Hynix NAND Product Solutions Corp. (Rancho Cordova, Calif.).

"Variable node data management for integrity check in memory systems" was invented by Zion Kwok (Burnaby, Canada).

According to the abstract* released by the U.S. Patent & Trademark Office: "This application is directed to data validation in an electronic device. The electronic device identifies a set of check nodes associated with a variable node that corresponds to a first data bit in a block of data, and obtains check node data from each check node. A hard decision likelihood is determined based on a check node data set including the check node data of each of the set of c...