US Patent Issued to SK hynix, Seoul National University R&DB Foundation on Oct. 14 for "Test aid units" (South Korean Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,442,853, issued on Oct. 14, was assigned to SK hynix Inc. (Icheon, South Korea) and Seoul National University R&DB Foundation (Seoul, South Korea).

"Test aid units" was invented by Deog Kyoon Jeong (Seoul, South Korea), Chan Ho Kye (Seoul, South Korea) and Ji Hee Kim (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is a test aid unit that is installed between automatic test equipment (ATE) and a device under test (DUT), generates a test data signal according to a data processing and transmission/reception rate of the DUT in response to a control signal transmitted from the ATE, transmits the test data signal to the DUT, self-...