US Patent Issued to SK hynix, Korea University Research and Business Foundation on Nov. 4 for "Dynamic fault clustering method and apparatus" (South Korean Inventors)

ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,462,892, issued on Nov. 4, was assigned to SK hynix Inc. (Icheon, South Korea) and Korea University Research and Business Foundation (Seoul, South Korea).

"Dynamic fault clustering method and apparatus" was invented by Jong Sun Park (Seoul, South Korea), Kwan Ho Bae (Seoul, South Korea), Jin Ho Jeong (Yongin, South Korea) and Seung Hwan Bang (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A dynamic fault clustering method and apparatus for efficiently managing redundancy in semiconductor memories performs a collection operation of searching for and detecting a fault and an operation of appropriately clustering the fault at the same tim...