US Patent Issued to Sintokogio on Sept. 9 for "Test system" (Japanese Inventor)

ALEXANDRIA, Va., Sept. 10 -- United States Patent no. 12,411,172, issued on Sept. 9, was assigned to Sintokogio Ltd. (Aichi, Japan).

"Test system" was invented by Nobuyuki Takita (Nagoya, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a system for use in synchronizing a plurality of connected units.The system includes a plurality of backplanes connected to at least one unit used in a characteristic test of a device and an integrated controller that controls the at least one unit. The plurality of backplanes are connected to each other in a tree structure."

The patent was filed on Feb. 12, 2024, under Application No. 18/438,993.

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