ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,460,914, issued on Nov. 4, was assigned to Sintokogio Ltd. (Aichi, Japan).
"Measurement system and checking method" was invented by Yoshikane Tanaami (Nagoya, Japan) and Miyuki Hayashi (Nagoya, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "In a measurement system, a processor sets, on the basis of three-dimensional data, a movement route to be taken by a hand part to cause a contact to follow the surface of an object to be measured in such a manner that a reaction force detected by a force sensor becomes a predetermined value. The processor causes the contact to follow the surface of the object to be measured while adjusting the reaction force to ...