ALEXANDRIA, Va., July 30 -- United States Patent no. 12,372,572, issued on July 29, was assigned to Silicon Laboratories Inc. (Austin, Texas).
"Transmit modulation testing" was invented by Anant Verma (Austin, Texas), Rangakrishnan Srinivasan (Austin, Texas) and Zhongda Wang (San Jose, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Modulation testing separately enables slices of an analog varactor array of an LC oscillator. For each enabled slice, a reference voltage supplying a resistor ladder is set to a plurality of different reference voltage values. Resistor ladder voltages generated for the different reference voltage values are supplied to the enabled slice and a control voltage coupled to the ...