ALEXANDRIA, Va., Sept. 17 -- United States Patent no. 12,416,659, issued on Sept. 16, was assigned to Silergy Semiconductor Technology (Hangzhou) LTD (Hangzhou, China).
"Method and device for fault detection" was invented by Nathan Hackett (Hangzhou, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method of performing fault detection can include: performing a sampling operation to obtain a first voltage signal and a first current signal from a circuit path; performing a phase adjustment on the first voltage signal and the first current signal to generate a second voltage signal and a second current signal; transmitting the second voltage signal and the second current signal to a fault detection networ...