US Patent Issued to SiLC Technology on Jan. 27 for "Reduction of ADC sampling rates in LIDAR systems" (California Inventors)

ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,535,586, issued on Jan. 27, was assigned to SiLC Technology Inc. (Monrovia, Calif.).

"Reduction of ADC sampling rates in LIDAR systems" was invented by Majid Boloorian (San Diego), Dazeng Feng (El Monte, Calif.) and Mehdi Asghari (La Canada Flintridge, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A LIDAR system includes a LIDAR chip that is configured to output a LIDAR output signal such that the LIDAR output signal can be reflected by an object located off the LIDAR chip. The LIDAR chip is also configured to receive a LIDAR input signal that includes light from the reflected LIDAR output signal. The LIDAR chip is configured to combine the LIDA...