US Patent Issued to SIKORA on Nov. 18 for "Method and device for determining the refractive index of a surface region of an object" (German Inventors)

ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,474,264, issued on Nov. 18, was assigned to SIKORA AG (Bremen, Germany).

"Method and device for determining the refractive index of a surface region of an object" was invented by Harald Sikora (Bremen, Germany) and Armin Holle (Achim, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for determining a refractive index in a surface region of an object from a production system which has not cooled to an ambient temperature includes emitting terahertz radiation from a transmitter at an angle of incidence to the surface region of the object. The terahertz radiation is reflected from the surface region of the object and received by a receiver. ...