US Patent Issued to Sigray on Sept. 30 for "System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes" (California Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,437, issued on Sept. 30, was assigned to Sigray Inc. (Benicia, Calif.).

"System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes" was invented by Wenbing Yun (Walnut Creek, Calif.), Janos Kirz (Berkeley, Calif.) and Sylvia Jia Yun Lewis (San Francisco).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus includes an x-ray source configured to generate x-rays, at least some of which impinge a sample and at least one diffractor configured to concurrently diffract at least some of the x-rays from the sample in a first direction and in a second direction substantially orthogonal to the first direc...