US Patent Issued to Sigray on Sept. 30 for "System and method for generating a focused x-ray beam" (California Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,431,256, issued on Sept. 30, was assigned to Sigray Inc. (Benicia, Calif.).

"System and method for generating a focused x-ray beam" was invented by Benjamin Donald Stripe (Berkeley, Calif.), Wenbing Yun (Walnut Creek, Calif.), Janos Kirz (Berkeley, Calif.), Thomas James Smart (Oakland, Calif.), Mark Antoine Cordier (El Sobrante, Calif.) and Sylvia Jia Yun Lewis (San Francisco).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus includes at least one x-ray source configured to generate x-rays and at least one capillary x-ray focusing optic configured to receive and focus at least some of the generated x-rays into a focused x-ray beam. The apparat...