ALEXANDRIA, Va., Sept. 17 -- United States Patent no. 12,417,163, issued on Sept. 16, was assigned to SiFive Inc. (Santa Clara, Calif.).
"Selectable granularity performance monitor" was invented by Richard Van (San Jose, Calif.) and Huang Chao Wei (Zhubei, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods are described to collect latency data of transactions traversing a processor using a performance monitor, which uses a bucket timer based on a granule value in a configurable granule counter. The monitor can determine a transaction time for a transaction, which can then be compared to enumerated buckets (where the bucket size is based on the granule value), determine the appropriate ...